s o t -2 2 7 isotop ? file # e145592 "ul recognized" g s s d n-channel mosfet absolute maximum ratings thermal and mechanical characteristics g d s single die mosfet unit a v mj a unit w c/w c v oz g inlbf nm ratings 25 16 140 30 2165 18 min typ max 545 0.23 0.15 -55 150 2500 1.03 29.2 10 1.1 parameter continuous drain current @ t c = 25c continuous drain current @ t c = 100c pulsed drain current 1 gate-source voltage single pulse avalanche energy 2 avalanche current, repetitive or non-repetitive characteristic total power dissipation @ t c = 25c junction to case thermal resistance case to sink thermal resistance, flat, greased surface operating and storage junction temperature range rms voltage (50-60hhz sinusoidal waveform from terminals to mounting base for 1 min.) package weight terminals and mounting screws. symbol i d i dm v gs e as i ar symbol p d r jc r cs t j ,t stg v isolation w t torque typical applications ? pfc and other boost converter ? buck converter ? two switch forward (asymmetrical bridge) ? single switch forward ? flyback ? inverters features ? fast switching with low emi/rfi ? low r ds(on) ? ultra low c rss for improved noise immunity ? low gate charge ? avalanche energy rated ? rohs compliant apt25m100j 1000v, 25a, 0.33 max apt25m100j power mos 8 ? is a high speed, high voltage n-channel switch-mode power mosfet. a proprietary planar stripe design yields excellent reliability and manufacturability. low switching loss is achieved with low input capacitance and ultra low c rss "miller" capaci- tance. the intrinsic gate resistance and capacitance of the poly-silicon gate structure help control slew rates during switching, resulting in low emi and reliable paralleling, even when switching at very high frequency. reliability in ? yback, boost, forward, and other circuits is enhanced by the high avalanche energy capability. microsemi website - http://www.microsemi.com 050-8100 rev b 5-2009
static characteristics t j = 25c unless otherwise speci? ed source-drain diode characteristics dynamic characteristics t j = 25c unless otherwise speci? ed 1 repetitive rating: pulse width and case temperature limited by maximum junction temperature. 2 starting at t j = 25c, l = 13.36mh, r g = 2.2 , i as = 18a. 3 pulse test: pulse width < 380s, duty cycle < 2%. 4 c o(cr) is de? ned as a ? xed capacitance with the same stored charge as c oss with v ds = 67% of v (br)dss . 5 c o(er) is de? ned as a ? xed capacitance with the same stored energy as c oss with v ds = 67% of v (br)dss . to calculate c o(er) for any value of v ds less than v (br)dss, use this equation: c o(er) = -2.85e-7/v ds ^2 + 5.04e-8/v ds + 9.75e-11. 6 r g is external gate resistance, not including internal gate resistance or gate driver impedance. (mic4452) microsemi reserves the right to change, without notice, the speci? cations and information contained herein. g d s unit v v/c v mv/c a na unit a v ns c v/ns unit s pf nc ns min typ max 1000 1.15 0.29 0.33 3 4 5 -10 100 500 100 min typ max 25 140 1 1165 33 10 min typ max 39 9835 130 825 335 170 305 55 145 44 40 150 38 test conditions v gs = 0v , i d = 250a reference to 25c, i d = 250a v gs = 10v , i d = 18a v gs = v ds , i d = 2.5ma v ds = 1000v t j = 25c v gs = 0v t j = 125c v gs = 30v test conditions mosfet symbol showing the integral reverse p-n junction diode (body diode) i sd = 18a , t j = 25c, v gs = 0v i sd = 18a 3 di sd / dt = 100a/s, t j = 25c i sd 18a, di/dt 1000a/s, v dd = 100v, t j = 125c test conditions v ds = 50v , i d = 18a v gs = 0v , v ds = 25v f = 1mhz v gs = 0v , v ds = 0v to 667v v gs = 0 to 10v , i d = 18a, v ds = 500v resistive switching v dd = 667v , i d = 18a r g = 2.2 6 , v gg = 15v parameter drain-source breakdown voltage breakdown voltage temperature coef? cient drain-source on resistance 3 gate-source threshold voltage threshold voltage temperature coef? cient zero gate voltage drain current gate-source leakage current parameter continuous source current (body diode) pulsed source current (body diode) 1 diode forward voltage reverse recovery time reverse recovery charge peak recovery dv/dt parameter forward transconductance input capacitance reverse transfer capacitance output capacitance effective output capacitance, charge related effective output capacitance, energy related total gate charge gate-source charge gate-drain charge turn-on delay time current rise time turn-off delay time current fall time symbol v br(dss) v br(dss) / t j r ds(on) v gs(th) v gs(th) / t j i dss i gss symbol i s i sm v sd t rr q rr dv/dt symbol g fs c iss c rss c oss c o(cr) 4 c o(er) 5 q g q gs q gd t d(on) t r t d(off) t f 050-8100 rev b 5-2009 apt25m100j
v gs = 6, 7, 8 & 9v 4.5v t j = 125c t j = 25c t j = -55c v gs = 10v 5v v ds > i d(on) x r ds(on) max. 250sec. pulse test @ <0.5 % duty cycle normalized to v gs = 10v @ 18a t j = 125c t j = 25c t j = -55c c oss c iss i d = 18a v ds = 800v v ds = 200v v ds = 500v t j = 150c t j = 25c t j = 125c t j = 150c c rss t j = 125c t j = 25c t j = -55c v gs , gate-to-source voltage (v) g fs , transconductance r ds(on) , drain-to-source on resistance i d , drain current (a) i sd, reverse drain current (a) c, capacitance (pf) i d , drain current (a) i d , drian current (a) v ds(on) , drain-to-source voltage (v) v ds , drain-to-source voltage (v) figure 1, output characteristics figure 2, output characteristics t j , junction temperature (c) v gs , gate-to-source voltage (v) figure 3, r ds(on) vs junction temperature figure 4, transfer characteristics i d , drain current (a) v ds , drain-to-source voltage (v) figure 5, gain vs drain current figure 6, capacitance vs drain-to-source voltage q g , total gate charge (nc) v sd , source-to-drain voltage (v) figure 7, gate charge vs gate-to-source voltage figure 8, reverse drain current vs source-to-drain voltage 0 5 10 15 20 25 30 0 5 10 15 20 25 30 -55 -25 0 25 50 75 100 125 150 0 1 2 3 4 5 6 7 8 0 5 10 15 20 25 0 200 400 600 800 1000 0 50 100 150 200 250 300 350 400 0 0.3 0.6 0.9 1.2 1.5 120 100 80 60 40 20 0 3.0 2.5 2.0 1.5 1.0 0.5 0 50 40 30 20 10 0 16 14 12 10 8 6 4 2 0 40 35 30 25 20 15 10 5 0 140 120 100 80 60 40 20 0 20,000 10,000 1000 100 10 140 120 100 80 60 40 20 0 apt25m100j 050-8100 rev b 5-2009
31.5 (1.240) 31.7 (1.248) dimensions in millimeters and (inches) 7.8 (.307) 8.2 (.322) 30.1 (1.185) 30.3 (1.193) 38.0 (1.496) 38.2 (1.504) 14.9 (.587) 15.1 (.594) 11.8 (.463) 12.2 (.480) 8.9 (.350) 9.6 (.378) hex nut m4 (4 places) 0.75 (.030) 0.85 (.033) 12.6 (.496) 12.8 (.504) 25.2 (0.992) 25.4 (1.000) 1.95 (.077) 2.14 (.084) * source drain gate * r = 4.0 (.157) (2 places) 4.0 (.157) 4.2 (.165) (2 places) w=4.1 (.161) w=4.3 (.169) h=4.8 (.187) h=4.9 (.193) (4 places) 3.3 (.129) 3.6 (.143) * source emitter terminals are shorted internally. current handling capability is equal for either source terminal. sot-227 (isotop ? ) package outline isotop ? is a registered trademark of st microelectronics nv. microsemi's products are covered by one or more of u.s.patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 and foreign patents. us and f oreign patents pending. all rights reserved. 0.5 single pulse 0.1 0.3 0.7 0.05 d = 0.9 peak t j = p dm x z jc + t c duty factor d = t 1 / t 2 t 2 t 1 p dm note: t 1 = pulse duration 1ms 100ms r ds(on) scaling for different case & junction temperatures: i d = i d(t c = 25 c) *( t j - t c )/125 dc line 100s i dm 10ms 13s 100s i dm 100ms 10ms 13s r ds(on) dc line t j = 150c t c = 25c 1ms t j = 125c t c = 75c i d , drain current (a) v ds , drain-to-source voltage (v) v ds , drain-to-source voltage (v) figure 9, forward safe operating area figure 10, maximum forward safe operating area z jc , thermal impedance (c/w) 10 -5 10 -4 10 -3 10 -2 10 -1 1.0 rectangular pulse duration (seconds) figure 11. maximum effective transient thermal impedance junction-to-case vs pulse duration i d , drain current (a) 1 10 100 1000 1 10 100 1000 0.25 0.20 0.15 0.10 0.05 0 200 100 10 1 0.1 200 100 10 1 0.1 apt25m100j 050-8100 rev b 5-2009
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